QTL mapping for leaf senescence-related traits in common wheat under limited and full irrigation

Leaf senescence is an important trait for yield improvement under stress

Abstract

Leaf senescence is an important trait for yield improvement under stress. In the present study, 207 F2:4 random inbred lines (RILs) derived from the Jingdong 8/Aikang 58 cross were investigated under limited and full irrigation environments at two locations during the 2011–2012 and 2012–2013 cropping seasons.

Citation

Li XingMao; He ZhongHe; Xiao YongGui; Xia XianChun; Trethowan, R.; Wang HuaJun; Chen XinMin. QTL mapping for leaf senescence-related traits in common wheat under limited and full irrigation. Euphytica (2014) : [DOI: 10.1007/s10681-014-1272-4]

QTL mapping for leaf senescence-related traits in common wheat under limited and full irrigation

Published 1 January 2014